IEC 62047-40 Ed. 1.0 en – Semiconductor devices – Micro-electromechanical devices – Part 40: Test methods of micro-electromechanical inertial shock switch threshold
This part of IEC 62047 specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open microelectromechanical inertial shock switch.
Product Details
- Edition:
- 1.0
- Published:
- 09/01/2021
- ISBN(s):
- 9782832210187
- Number of Pages:
- 16
- File Size:
- 1 file , 1.2 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
