ASTM E673 – Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
Product Details
- Published:
- 12/01/2003
- Number of Pages:
- 10
- File Size:
- 1 file , 94 KB
- Redline File Size:
- 2 files , 160 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
