IEC 60749-1 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
Product Details
- Edition:
- 1.0
- Published:
- 08/30/2002
- Number of Pages:
- 15
- File Size:
- 1 file , 390 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
