Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “”No Trouble Found”” and “”Electrical Overstress”” failures due to latch-up.
Product Details
- Edition:
- 1.0
- Published:
- 11/04/2003
- Number of Pages:
- 41
- File Size:
- 1 file , 920 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
