IEC 60749-30 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
Product Details
- Edition:
- 2.0
- Published:
- 08/17/2020
- Number of Pages:
- 26
- File Size:
- 1 file , 1.1 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
