IEC 60749-31 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
Product Details
- Edition:
- 1.0
- Published:
- 08/30/2002
- Number of Pages:
- 9
- File Size:
- 1 file , 330 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
