Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Product Details
- Edition:
- 1.0
- Published:
- 01/17/2003
- Number of Pages:
- 13
- File Size:
- 1 file , 270 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
