IEC 61445 Ed. 1.0 en – Digital Test Interchange Format (DTIF)
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
Product Details
- Edition:
- 1.0
- Published:
- 06/21/2012
- Number of Pages:
- 101
- File Size:
- 1 file , 1.8 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
