IEC 62047-32 Ed. 1.0 b

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Semiconductor devices – Micro-electromechanical devices – Part 32: Test method for the nonlinear vibration of MEMS resonators

Published by Publication Date Number of Pages
IEC 01/24/2019 37
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IEC 62047-32 Ed. 1.0 b – Semiconductor devices – Micro-electromechanical devices – Part 32: Test method for the nonlinear vibration of MEMS resonators

IEC 62047-32:2019 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators.

Product Details

Edition:
1.0
Published:
01/24/2019
Number of Pages:
37
File Size:
1 file , 1.5 MB
Note:
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