IEC 62215-3 Ed. 1.0 b – Integrated circuits – Measurement of impulse immunity – Part 3: Non-synchronous transient injection method
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Product Details
Edition:
1.0
Published:
07/17/2013
Number of Pages:
66
File Size:
1 file , 580 KB
Note:
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