IEC 62969-4 Ed. 1.0 b

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Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors

Published by Publication Date Number of Pages
IEC 06/18/2018 39
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IEC 62969-4 Ed. 1.0 b – Semiconductor devices – Semiconductor interface for automotive vehicles – Part 4: Evaluation method of data interface for automotive vehicle sensors

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Product Details

Edition:
1.0
Published:
06/18/2018
Number of Pages:
39
File Size:
1 file , 620 KB
Note:
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