IEEE 641

Original price was: $104.00.Current price is: $62.00.

IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

Published by Publication Date Number of Pages
IEEE 10/07/1988 34
PDF FormatPDF FormatMulti-User-AccessMulti-User AccessPrintablePrintableOnline downloadOnline Download
Category:

IEEE 641 – IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays

New IEEE Standard – Inactive-Withdrawn.This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.

Product Details

Published:
10/07/1988
ISBN(s):
9780738142357
Number of Pages:
34
File Size:
1 file , 2.6 MB
Product Code(s):
STDWD12195
Note:
This product is unavailable in Russia, Belarus