IEEE 641 – IEEE Standard Definitions and Characterization of Metal Nitride Oxide Semiconductor Arrays
New IEEE Standard – Inactive-Withdrawn.This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.
Product Details
- Published:
- 10/07/1988
- ISBN(s):
- 9780738142357
- Number of Pages:
- 34
- File Size:
- 1 file , 2.6 MB
- Product Code(s):
- STDWD12195
- Note:
- This product is unavailable in Russia, Belarus
