MIL DESC 5962-91727 Notice A – Revision

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MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOP, THREE-STATE OUTPUTS, MONOLITHIC SILICON
Amendment by Military Specifications and Standards, 05/02/1994

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Published:
05/02/1994
Number of Pages:
2
File Size:
1 file , 67 KB
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