The scope of this document is limited to dose-rate radiation effects on semiconductor electronics and is specifically intended to address hardness assurance at the piece-part level. Because the nature of dose-rate effects sometimes requires a close interaction between system hardness assurance and piece-part hardness assurance, some system requirements are also discussed.
Product Details
- Published:
- 09/05/2012
- Number of Pages:
- 1
- File Size:
- 1 file , 34 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
