
MIL MIL-STD-202/306
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Method 306, Quality Factor (Q)
Published by | Publication Date | Number of Pages |
MIL | 04/18/2015 | 5 |
MIL MIL-STD-202/306 – Method 306, Quality Factor (Q)
The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such as capacitors and inductors. By definition, the factor Q expresses the ratio of reactance to effective resistance of a circuit element. This numerical ratio is considered a “figure of merit” for a reactive component (or a resonant circuit utilizing such components) as it is a measure of the ability of the component (or circuit) to store energy compared to the energy it wastes. For this reason, Q is called “storage factor”. Q is thus equal to the inverse of the dissipation factor. Relationship also exists between Q and the properties of a tuned circuit, such as the resonant rise in voltage phenomena. Each of the relationships involving Q mentioned above can be applied to the direct or indirect measurement of Q.
Product Details
- Published:
- 04/18/2015
- Number of Pages:
- 5
- File Size:
- 1 file , 80 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus