Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Product Details
- Published:
- 12/09/2019
- Number of Pages:
- 345
- File Size:
- 1 file , 4.5 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
